Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2.

Saved in:
Bibliographic Details
Title: Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2.
Authors: Baer, D. R.1, don.baer@pnl.gov, Engelhard, M. H.1, Lea, A. S.1, Nachimuthu, P.1, Droubay, T. C.2, Kim, J.3, Lee, B.3, Mathews, C.3, Opila, R. L.4, Saraf, L. V.1, Stickle, W. F.5, Wallace, R. M.3, Wright, B. S.4
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Sep2010, Vol. 28 Issue 5, p1060-1072, 13p, 5 Charts, 8 Graphs
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 53422264
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Baer%2C+D%2E+R%2E%22">Baer, D. R.</searchLink><relatesTo>1</relatesTo>, <i>don.baer@pnl.gov</i><br /><searchLink fieldCode="AU" term="%22Engelhard%2C+M%2E+H%2E%22">Engelhard, M. H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lea%2C+A%2E+S%2E%22">Lea, A. S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Nachimuthu%2C+P%2E%22">Nachimuthu, P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Droubay%2C+T%2E+C%2E%22">Droubay, T. C.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+J%2E%22">Kim, J.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lee%2C+B%2E%22">Lee, B.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Mathews%2C+C%2E%22">Mathews, C.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Opila%2C+R%2E+L%2E%22">Opila, R. L.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Saraf%2C+L%2E+V%2E%22">Saraf, L. V.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Stickle%2C+W%2E+F%2E%22">Stickle, W. F.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Wallace%2C+R%2E+M%2E%22">Wallace, R. M.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Wright%2C+B%2E+S%2E%22">Wright, B. S.</searchLink><relatesTo>4</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+A-Vacuums%2C+Surfaces+%26+Films%22">Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films</searchLink>; Sep2010, Vol. 28 Issue 5, p1060-1072, 13p, 5 Charts, 8 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=53422264
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1116/1.3456123
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 13
        StartPage: 1060
    Titles:
      – TitleFull: Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Baer, D. R.
      – PersonEntity:
          Name:
            NameFull: Engelhard, M. H.
      – PersonEntity:
          Name:
            NameFull: Lea, A. S.
      – PersonEntity:
          Name:
            NameFull: Nachimuthu, P.
      – PersonEntity:
          Name:
            NameFull: Droubay, T. C.
      – PersonEntity:
          Name:
            NameFull: Kim, J.
      – PersonEntity:
          Name:
            NameFull: Lee, B.
      – PersonEntity:
          Name:
            NameFull: Mathews, C.
      – PersonEntity:
          Name:
            NameFull: Opila, R. L.
      – PersonEntity:
          Name:
            NameFull: Saraf, L. V.
      – PersonEntity:
          Name:
            NameFull: Stickle, W. F.
      – PersonEntity:
          Name:
            NameFull: Wallace, R. M.
      – PersonEntity:
          Name:
            NameFull: Wright, B. S.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Text: Sep2010
              Type: published
              Y: 2010
          Identifiers:
            – Type: issn-print
              Value: 07342101
          Numbering:
            – Type: volume
              Value: 28
            – Type: issue
              Value: 5
          Titles:
            – TitleFull: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
              Type: main
ResultId 1