Interface-enabled defect reduction in He ion irradiated metallic multilayers.
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| Title: | Interface-enabled defect reduction in He ion irradiated metallic multilayers. |
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| Authors: | Zhang, X.1, zhangx@tamu.edu, Fu, E. G., Misra, A.2, Demkowicz, M. J.3 |
| Source: | JOM: The Journal of The Minerals, Metals & Materials Society (TMS); Dec2010, Vol. 62 Issue 12, p75-78, 4p, 1 Color Photograph, 1 Black and White Photograph, 3 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 10474838 |
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| DOI: | 10.1007/s11837-010-0185-5 |
