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Towards traceable test-driven development.

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Bibliographic Details
Title: Towards traceable test-driven development.
Authors: Hayes, Jane Huffman, Dekhtyar, Alex, Janzen, David S.
Source: ICSE: International Conference on Software Engineering; May2009, p26-30, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 73588715
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 0
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TEFSE.2009.5069579
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 26
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      – TitleFull: Towards traceable test-driven development.
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            NameFull: Hayes, Jane Huffman
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            NameFull: Dekhtyar, Alex
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            NameFull: Janzen, David S.
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            – D: 18
              M: 05
              Text: May2009
              Type: published
              Y: 2009
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            – TitleFull: ICSE: International Conference on Software Engineering
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