Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors.
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| Title: | Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors. |
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| Authors: | Singer, A.1, amits@math.princeton.edu, Zhao, Z.2, zhizhenz@princeton.edu, Shkolnisky, Y.3, yoelsh@post.tau.ac.il, Hadani, R.4, hadani@math.utexas.edu |
| Source: | SIAM Journal on Imaging Sciences; 2011, Vol. 4 Issue 2, p723-759, 37p, 3 Black and White Photographs, 3 Diagrams, 10 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 19364954 |
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| DOI: | 10.1137/090778390 |
