APA (7th ed.) Citation

Singer, A., Zhao, Z., Shkolnisky, Y., & Hadani, R. (2011). Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors. SIAM Journal on Imaging Sciences, 4(2), 723. https://doi.org/10.1137/090778390

Chicago Style (17th ed.) Citation

Singer, A., Z. Zhao, Y. Shkolnisky, and R. Hadani. "Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors." SIAM Journal on Imaging Sciences 4, no. 2 (2011): 723. https://doi.org/10.1137/090778390.

MLA (9th ed.) Citation

Singer, A., et al. "Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors." SIAM Journal on Imaging Sciences, vol. 4, no. 2, 2011, p. 723, https://doi.org/10.1137/090778390.