Bibliographic Details
| Title: |
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors |
| Authors: |
Lo, Wen-Hung1, Chang, Ting-Chang1,2, tcchang@mail.phys.nsysu.edu.tw, Dai, Chih-Hao3, Chung, Wan-Lin1, Chen, Ching-En4, Ho, Szu-Han4, Tsai, Jyun-Yu1, Chen, Hua-Mao5, Liu, Guan-Ru1, Cheng, Osbert6, Huang, Cheng-Tung6 |
| Source: |
Thin Solid Films; Jan2013, Vol. 528, p10-18, 9p |
| Database: |
Applied Science & Technology Source |
