Electrical transport through a scanning tunnelling microscope tip and a heavily doped Si contact.
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| Title: | Electrical transport through a scanning tunnelling microscope tip and a heavily doped Si contact. |
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| Authors: | Zhang, Xieqiu1,2, Wang, Kedong2, Chen, Wenjin3, Loy, M. M. T.3, Wang, J. N.3, Xiao, Xudong1,2 |
| Source: | Journal of Applied Physics; Jul2013, Vol. 114 Issue 1, p013701-013701-5, 1p, 1 Color Photograph, 1 Diagram, 1 Graph |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.4812385 |
