APA (7th ed.) Citation

Zhang, X., Wang, K., Chen, W., Loy, M. M. T., Wang, J. N., & Xiao, X. (2013). Electrical transport through a scanning tunnelling microscope tip and a heavily doped Si contact. Journal of Applied Physics, 114(1), 013701. https://doi.org/10.1063/1.4812385

Chicago Style (17th ed.) Citation

Zhang, Xieqiu, Kedong Wang, Wenjin Chen, M. M. T. Loy, J. N. Wang, and Xudong Xiao. "Electrical Transport Through a Scanning Tunnelling Microscope Tip and a Heavily Doped Si Contact." Journal of Applied Physics 114, no. 1 (2013): 013701. https://doi.org/10.1063/1.4812385.

MLA (9th ed.) Citation

Zhang, Xieqiu, et al. "Electrical Transport Through a Scanning Tunnelling Microscope Tip and a Heavily Doped Si Contact." Journal of Applied Physics, vol. 114, no. 1, 2013, p. 013701, https://doi.org/10.1063/1.4812385.