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Model-based testing for concurrent systems with labelled event structures.

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Bibliographic Details
Title:	Model-based testing for concurrent systems with labelled event structures.
Authors:	León, Hernán Ponce^1,2, Haar, Stefan^1,2, Longuet, Delphine³
Source:	Software Testing: Verification & Reliability; Nov2014, Vol. 24 Issue 7, p558-590, 33p
Database:	Applied Science & Technology Source
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Description
ISSN:	09600833
DOI:	10.1002/stvr.1543