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Model-based testing for concurrent systems with labelled event structures.

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Title: Model-based testing for concurrent systems with labelled event structures.
Authors: León, Hernán Ponce1,2, Haar, Stefan1,2, Longuet, Delphine3
Source: Software Testing: Verification & Reliability; Nov2014, Vol. 24 Issue 7, p558-590, 33p
Database: Applied Science & Technology Source
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        Value: 10.1002/stvr.1543
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        Text: English
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              Text: Nov2014
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