Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs.

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Bibliographic Details
Title: Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs.
Authors: Liu, Kuan-Ju1, Chang, Ting-Chang1,2, Yang, Ren-Ya3, Chen, Ching-En4, Ho, Szu-Han4, Tsai, Jyun-Yu1, Hsieh, Tien-Yu1, Cheng, Osbert5, Huang, Cheng-Tung5
Source: Thin Solid Films; Dec2014, Vol. 572, p39-43, 5p
Database: Applied Science & Technology Source
Description
ISSN:00406090
DOI:10.1016/j.tsf.2014.08.031