APA (7th ed.) Citation

Liu, K., Chang, T., Yang, R., Chen, C., Ho, S., Tsai, J., . . . Huang, C. (2014). Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs. Thin Solid Films, 572, 39. https://doi.org/10.1016/j.tsf.2014.08.031

Chicago Style (17th ed.) Citation

Liu, Kuan-Ju, Ting-Chang Chang, Ren-Ya Yang, Ching-En Chen, Szu-Han Ho, Jyun-Yu Tsai, Tien-Yu Hsieh, Osbert Cheng, and Cheng-Tung Huang. "Abnormal Temperature-dependent Floating-body Effect on Hot-Carrier Degradation in PDSOI N-MOSFETs." Thin Solid Films 572 (2014): 39. https://doi.org/10.1016/j.tsf.2014.08.031.

MLA (9th ed.) Citation

Liu, Kuan-Ju, et al. "Abnormal Temperature-dependent Floating-body Effect on Hot-Carrier Degradation in PDSOI N-MOSFETs." Thin Solid Films, vol. 572, 2014, p. 39, https://doi.org/10.1016/j.tsf.2014.08.031.