APA (7th ed.) Citation

Pöller, F., Salazar Bloise, F., Jakobi, M., Wang, S., Dong, J., & Koch, A. W. (2019). Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects. Sensors (14248220), 19(10), 2215. https://doi.org/10.3390/s19102215

Chicago Style (17th ed.) Citation

Pöller, Franziska, Félix Salazar Bloise, Martin Jakobi, Shengjia Wang, Jie Dong, and Alexander W. Koch. "Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects." Sensors (14248220) 19, no. 10 (2019): 2215. https://doi.org/10.3390/s19102215.

MLA (9th ed.) Citation

Pöller, Franziska, et al. "Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects." Sensors (14248220), vol. 19, no. 10, 2019, p. 2215, https://doi.org/10.3390/s19102215.