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Characterizing the intrinsic properties of individual XFEL pulses via single‐particle diffraction.

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Title: Characterizing the intrinsic properties of individual XFEL pulses via single‐particle diffraction.
Authors: Lee, Heemin1 (AUTHOR), Shin, Jaeyong1 (AUTHOR), Cho, Do Hyung1 (AUTHOR), Jung, Chulho1 (AUTHOR), Sung, Daeho1 (AUTHOR), Ahn, Kangwoo2 (AUTHOR), Nam, Daewoong3 (AUTHOR), Kim, Sangsoo3 (AUTHOR), Kim, Kyung Sook3 (AUTHOR), Park, Sang-Yeon3 (AUTHOR), Fan, Jiadong4 (AUTHOR), Jiang, Huaidong4 (AUTHOR), Kang, Hyun Chol5 (AUTHOR), Tono, Kensuke6 (AUTHOR), Yabashi, Makina7 (AUTHOR), Ishikawa, Tetsuya7 (AUTHOR), Noh, Do Young2 (AUTHOR), Song, Changyong1 (AUTHOR) cysong@postech.ac.kr
Source: Journal of Synchrotron Radiation. Jan2020, Vol. 27 Issue 1, p17-24. 8p.
Database: Academic Search Ultimate
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Description
ISSN:09090495
DOI:10.1107/S1600577519015443