APA (7th ed.) Citation

Lee, H., Shin, J., Cho, D. H., Jung, C., Sung, D., Ahn, K., . . . Song, C. (2020). Characterizing the intrinsic properties of individual XFEL pulses via single‐particle diffraction. Journal of Synchrotron Radiation, 27(1), 17. https://doi.org/10.1107/S1600577519015443

Chicago Style (17th ed.) Citation

Lee, Heemin, et al. "Characterizing the Intrinsic Properties of Individual XFEL Pulses via Single‐particle Diffraction." Journal of Synchrotron Radiation 27, no. 1 (2020): 17. https://doi.org/10.1107/S1600577519015443.

MLA (9th ed.) Citation

Lee, Heemin, et al. "Characterizing the Intrinsic Properties of Individual XFEL Pulses via Single‐particle Diffraction." Journal of Synchrotron Radiation, vol. 27, no. 1, 2020, p. 17, https://doi.org/10.1107/S1600577519015443.