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Defect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning.

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Bibliographic Details
Title: Defect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning.
Authors: Cho, Philip1 (AUTHOR) philip.cho@afit.edu, Wood, Aihua1 (AUTHOR) philip.cho@afit.edu, Mahalingam, Krishnamurthy2 (AUTHOR) krishnamurthy.mahalingam.ctr@us.af.mil, Eyink, Kurt2 (AUTHOR) kurt.eyink@us.af.mil
Source: Mathematics (2227-7390). Jun2021, Vol. 9 Issue 11, p1209. 1p.
Database: Academic Search Ultimate
Description
ISSN:22277390
DOI:10.3390/math9111209