Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.
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| Title: | Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain. |
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| Authors: | Pöller, Franziska1 (AUTHOR) franziska.poeller@tum.de, Salazar Bloise, Félix2 (AUTHOR) felixjose.salazar@upm.es, Jakobi, Martin1 (AUTHOR) jie.dong@tum.de, Dong, Jie1 (AUTHOR) a.w.koch@tum.de, Koch, Alexander W.1 (AUTHOR) |
| Source: | Sensors (14248220). Aug2021, Vol. 21 Issue 16, p5572-5572. 1p. |
| Database: | Academic Search Ultimate |
| ISSN: | 14248220 |
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| DOI: | 10.3390/s21165572 |
