APA (7th ed.) Citation

Pöller, F., Salazar Bloise, F., Jakobi, M., Dong, J., & Koch, A. W. (2021). Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain. Sensors (14248220), 21(16), 5572. https://doi.org/10.3390/s21165572

Chicago Style (17th ed.) Citation

Pöller, Franziska, Félix Salazar Bloise, Martin Jakobi, Jie Dong, and Alexander W. Koch. "Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain." Sensors (14248220) 21, no. 16 (2021): 5572. https://doi.org/10.3390/s21165572.

MLA (9th ed.) Citation

Pöller, Franziska, et al. "Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain." Sensors (14248220), vol. 21, no. 16, 2021, p. 5572, https://doi.org/10.3390/s21165572.