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Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.

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Title: Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.
Authors: Pöller, Franziska1 (AUTHOR) franziska.poeller@tum.de, Salazar Bloise, Félix2 (AUTHOR) felixjose.salazar@upm.es, Jakobi, Martin1 (AUTHOR) jie.dong@tum.de, Dong, Jie1 (AUTHOR) a.w.koch@tum.de, Koch, Alexander W.1 (AUTHOR)
Source: Sensors (14248220). Aug2021, Vol. 21 Issue 16, p5572-5572. 1p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Aug2021, Vol. 21 Issue 16, p5572-5572. 1p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=152146126
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