First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.
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| Title: | First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission. |
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| Authors: | Nogami, M.1 mitsuhiro.nogami.c4@tohoku.ac.jp, Hitomi, K.1, Terakawa, A.2, Ishii, K.2 |
| Source: | International Journal of PIXE. 2019, Vol. 29 Issue 1/2, p53-59. 7p. |
| Database: | Academic Search Ultimate |
| ISSN: | 01290835 |
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| DOI: | 10.1142/S0129083519500153 |
