APA (7th ed.) Citation

Nogami, M., Hitomi, K., Terakawa, A., & Ishii, K. (2019). First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission. International Journal of PIXE, 29(1/2), 53. https://doi.org/10.1142/S0129083519500153

Chicago Style (17th ed.) Citation

Nogami, M., K. Hitomi, A. Terakawa, and K. Ishii. "First In-beam Application of Thallium Bromide Semiconductor Detectors to Particle-induced X-ray Emission." International Journal of PIXE 29, no. 1/2 (2019): 53. https://doi.org/10.1142/S0129083519500153.

MLA (9th ed.) Citation

Nogami, M., et al. "First In-beam Application of Thallium Bromide Semiconductor Detectors to Particle-induced X-ray Emission." International Journal of PIXE, vol. 29, no. 1/2, 2019, p. 53, https://doi.org/10.1142/S0129083519500153.