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First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.

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Title: First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.
Authors: Nogami, M.1 mitsuhiro.nogami.c4@tohoku.ac.jp, Hitomi, K.1, Terakawa, A.2, Ishii, K.2
Source: International Journal of PIXE. 2019, Vol. 29 Issue 1/2, p53-59. 7p.
Database: Academic Search Ultimate
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  Data: First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+PIXE%22">International Journal of PIXE</searchLink>. 2019, Vol. 29 Issue 1/2, p53-59. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=152244587
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1142/S0129083519500153
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      – Code: eng
        Text: English
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        PageCount: 7
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      – TitleFull: First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.
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            NameFull: Nogami, M.
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            NameFull: Hitomi, K.
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            NameFull: Terakawa, A.
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              Text: 2019
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              Y: 2019
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              Value: 29
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              Value: 1/2
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            – TitleFull: International Journal of PIXE
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