Thermal Stability of HfO2|AlGaN|GaN Normally-Off Transistors with Ni|Au and Pt Gate Metals.
Saved in:
| Title: | Thermal Stability of HfO |
|---|---|
| Authors: | Lin, Y.-C.1 (AUTHOR), Niu, J.-S.1 (AUTHOR), Liu, W.-C.1 (AUTHOR), Tsai, J.-H.2 (AUTHOR) jhtsai@nknucc.nknu.edu.tw |
| Source: | Semiconductors. Jul2021, Vol. 55 Issue 7, p608-616. 9p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 10637826 |
|---|---|
| DOI: | 10.1134/S1063782621070095 |
