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Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL.

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Title: Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL.
Authors: Tavakkoly, Marziyeh1,2 (AUTHOR) marziyeh.tavakkoly@xfel.eu, Chalupsky, Jaromir3 (AUTHOR), Hajkova, Vera3 (AUTHOR), Hillert, Wolfgang2,4 (AUTHOR), Jelinek, Simon3,5,6 (AUTHOR), Juha, Libor3 (AUTHOR), Makita, Mikako1 (AUTHOR), Mazza, Tommaso1 (AUTHOR), Meyer, Michael1 (AUTHOR), Montano, Jacobo1 (AUTHOR), Sinn, Harald1 (AUTHOR), Vozda, Vojtech3 (AUTHOR), Vannoni, Maurizio1 (AUTHOR)
Source: Journal of Synchrotron Radiation. Sep2024, Vol. 31 Issue 5, p1067-1070. 4p.
Database: Academic Search Ultimate
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ISSN:09090495
DOI:10.1107/S1600577524007318