APA (7th ed.) Citation

Tavakkoly, M., Chalupsky, J., Hajkova, V., Hillert, W., Jelinek, S., Juha, L., . . . Vannoni, M. (2024). Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL. Journal of Synchrotron Radiation, 31(5), 1067. https://doi.org/10.1107/S1600577524007318

Chicago Style (17th ed.) Citation

Tavakkoly, Marziyeh, et al. "Comparing Single‐shot Damage Thresholds of Boron Carbide and Silicon at the European XFEL." Journal of Synchrotron Radiation 31, no. 5 (2024): 1067. https://doi.org/10.1107/S1600577524007318.

MLA (9th ed.) Citation

Tavakkoly, Marziyeh, et al. "Comparing Single‐shot Damage Thresholds of Boron Carbide and Silicon at the European XFEL." Journal of Synchrotron Radiation, vol. 31, no. 5, 2024, p. 1067, https://doi.org/10.1107/S1600577524007318.