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Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL.

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Bibliographic Details
Title:	Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL.
Authors:	Tavakkoly, Marziyeh^1,2 (AUTHOR) marziyeh.tavakkoly@xfel.eu, Chalupsky, Jaromir³ (AUTHOR), Hajkova, Vera³ (AUTHOR), Hillert, Wolfgang^2,4 (AUTHOR), Jelinek, Simon^3,5,6 (AUTHOR), Juha, Libor³ (AUTHOR), Makita, Mikako¹ (AUTHOR), Mazza, Tommaso¹ (AUTHOR), Meyer, Michael¹ (AUTHOR), Montano, Jacobo¹ (AUTHOR), Sinn, Harald¹ (AUTHOR), Vozda, Vojtech³ (AUTHOR), Vannoni, Maurizio¹ (AUTHOR)
Source:	Journal of Synchrotron Radiation. Sep2024, Vol. 31 Issue 5, p1067-1070. 4p.
Database:	Academic Search Ultimate
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