APA (7th ed.) Citation

Iwata, H., Yamasaki, K., & Yamaguchi, K. (2024). Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements. Journal of Electronic Testing, 40(4), 497. https://doi.org/10.1007/s10836-024-06128-4

Chicago Style (17th ed.) Citation

Iwata, Hiroshi, Kokoro Yamasaki, and Ken'ichi Yamaguchi. "Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements." Journal of Electronic Testing 40, no. 4 (2024): 497. https://doi.org/10.1007/s10836-024-06128-4.

MLA (9th ed.) Citation

Iwata, Hiroshi, et al. "Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements." Journal of Electronic Testing, vol. 40, no. 4, 2024, p. 497, https://doi.org/10.1007/s10836-024-06128-4.