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Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.

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Title: Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.
Authors: Iwata, Hiroshi1 (AUTHOR) iwata@info.nara-k.ac.jp, Yamasaki, Kokoro1 (AUTHOR), Yamaguchi, Ken'ichi1 (AUTHOR)
Source: Journal of Electronic Testing. Aug2024, Vol. 40 Issue 4, p497-508. 12p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 180254150
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.
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  Data: <searchLink fieldCode="AR" term="%22Iwata%2C+Hiroshi%22">Iwata, Hiroshi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> iwata@info.nara-k.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Yamasaki%2C+Kokoro%22">Yamasaki, Kokoro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yamaguchi%2C+Ken'ichi%22">Yamaguchi, Ken'ichi</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Testing%22">Journal of Electronic Testing</searchLink>. Aug2024, Vol. 40 Issue 4, p497-508. 12p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=180254150
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10836-024-06128-4
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 12
        StartPage: 497
    Titles:
      – TitleFull: Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Iwata, Hiroshi
      – PersonEntity:
          Name:
            NameFull: Yamasaki, Kokoro
      – PersonEntity:
          Name:
            NameFull: Yamaguchi, Ken'ichi
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          Dates:
            – D: 01
              M: 08
              Text: Aug2024
              Type: published
              Y: 2024
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              Value: 40
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              Value: 4
          Titles:
            – TitleFull: Journal of Electronic Testing
              Type: main
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