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A generalised FK model for the 558 line defect in graphene.

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Bibliographic Details
Title: A generalised FK model for the 558 line defect in graphene.
Authors: Yao, Yin1 (AUTHOR), Yang, Jingjing1 (AUTHOR), He, Yafeng2,3 (AUTHOR), Bai, Jianhui2,3 (AUTHOR) phybai@live.com
Source: Philosophical Magazine Letters. Dec2024, Vol. 104 Issue 1, p1-8. 8p.
Database: Academic Search Ultimate
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Description
ISSN:09500839
DOI:10.1080/09500839.2023.2293005