APA (7th ed.) Citation

Yao, Y., Yang, J., He, Y., & Bai, J. (2024). A generalised FK model for the 558 line defect in graphene. Philosophical Magazine Letters, 104(1), 1. https://doi.org/10.1080/09500839.2023.2293005

Chicago Style (17th ed.) Citation

Yao, Yin, Jingjing Yang, Yafeng He, and Jianhui Bai. "A Generalised FK Model for the 558 Line Defect in Graphene." Philosophical Magazine Letters 104, no. 1 (2024): 1. https://doi.org/10.1080/09500839.2023.2293005.

MLA (9th ed.) Citation

Yao, Yin, et al. "A Generalised FK Model for the 558 Line Defect in Graphene." Philosophical Magazine Letters, vol. 104, no. 1, 2024, p. 1, https://doi.org/10.1080/09500839.2023.2293005.