Deep multi-metrics learning for mobile app defect prediction using code and process metrics.

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Bibliographic Details
Title: Deep multi-metrics learning for mobile app defect prediction using code and process metrics.
Authors: Abdu, Ahmed1 (AUTHOR), Abdo, Hakim A.2 (AUTHOR), Ullah, Inam3 (AUTHOR), Khan, Jawad4 (AUTHOR), Gu, Yeong Hyeon5 (AUTHOR) yhgu@sejong.ac.kr, Algabri, Redhwan6 (AUTHOR) redhwan@sejong.ac.kr
Source: Scientific Reports. 11/4/2025, Vol. 15 Issue 1, p1-21. 21p.
Database: Academic Search Ultimate
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Description
ISSN:20452322
DOI:10.1038/s41598-025-22566-2