Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection.
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| Title: | Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection. |
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| Authors: | Hwang, K.-J.1 (AUTHOR) jhwang@swri.edu, Dokgo, K.1 (AUTHOR), Choi, E.1 (AUTHOR), Burch, J. L.1 (AUTHOR), Bessho, N.2,3 (AUTHOR), Hasegawa, H.4 (AUTHOR), Nakamura, R.5 (AUTHOR), Escoubet, C. P.6 (AUTHOR), Fu, H. S.7 (AUTHOR), Fu, W. D.7 (AUTHOR), Pollock, C. J.8 (AUTHOR) |
| Source: | Astrophysical Journal. 2026, Vol. 998 Issue 1, p1-8. 8p. |
| Database: | Academic Search Ultimate |
| ISSN: | 0004637X |
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| DOI: | 10.3847/1538-4357/ae3536 |
