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Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection.

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Title: Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection.
Authors: Hwang, K.-J.1 (AUTHOR) jhwang@swri.edu, Dokgo, K.1 (AUTHOR), Choi, E.1 (AUTHOR), Burch, J. L.1 (AUTHOR), Bessho, N.2,3 (AUTHOR), Hasegawa, H.4 (AUTHOR), Nakamura, R.5 (AUTHOR), Escoubet, C. P.6 (AUTHOR), Fu, H. S.7 (AUTHOR), Fu, W. D.7 (AUTHOR), Pollock, C. J.8 (AUTHOR)
Source: Astrophysical Journal. 2026, Vol. 998 Issue 1, p1-8. 8p.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 191307365
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  Data: Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection.
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  Data: <searchLink fieldCode="JN" term="%22Astrophysical+Journal%22">Astrophysical Journal</searchLink>. 2026, Vol. 998 Issue 1, p1-8. 8p.
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              Text: 2026
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