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Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis.

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Bibliographic Details
Title:	Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis.
Authors:	Ma, Xiaolong¹ (AUTHOR), Wang, Xiaofei¹ (AUTHOR), Zhai, Ruizhan¹ (AUTHOR), Jia, Zhongqing¹ (AUTHOR), Zhang, Wei¹ (AUTHOR), Zhao, Bing¹ (AUTHOR), Guan, Chen¹ (AUTHOR) guanchen1993@qlu.edu.cn
Source:	Sensors (14248220). Apr2026, Vol. 26 Issue 7, p2032. 33p.
Database:	Academic Search Ultimate
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ISSN:	14248220
DOI:	10.3390/s26072032