APA (7th ed.) Citation

Ma, X., Wang, X., Zhai, R., Jia, Z., Zhang, W., Zhao, B., & Guan, C. (2026). Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis. Sensors (14248220), 26(7), 2032. https://doi.org/10.3390/s26072032

Chicago Style (17th ed.) Citation

Ma, Xiaolong, Xiaofei Wang, Ruizhan Zhai, Zhongqing Jia, Wei Zhang, Bing Zhao, and Chen Guan. "Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis." Sensors (14248220) 26, no. 7 (2026): 2032. https://doi.org/10.3390/s26072032.

MLA (9th ed.) Citation

Ma, Xiaolong, et al. "Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis." Sensors (14248220), vol. 26, no. 7, 2026, p. 2032, https://doi.org/10.3390/s26072032.