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Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis.

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Title: Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis.
Authors: Ma, Xiaolong1 (AUTHOR), Wang, Xiaofei1 (AUTHOR), Zhai, Ruizhan1 (AUTHOR), Jia, Zhongqing1 (AUTHOR), Zhang, Wei1 (AUTHOR), Zhao, Bing1 (AUTHOR), Guan, Chen1 (AUTHOR) guanchen1993@qlu.edu.cn
Source: Sensors (14248220). Apr2026, Vol. 26 Issue 7, p2032. 33p.
Database: Academic Search Ultimate
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  Data: Stabilizing Defect Visibility Under Overexposure in Fringe-Based Imaging via γ Nonlinearity Analysis.
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        Value: 10.3390/s26072032
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              Text: Apr2026
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