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NMOS Hot Carrier Stressed Current Degradation Due to Hydrogen Deactivation of Dopant Determined by Junction Profiling.

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Title: NMOS Hot Carrier Stressed Current Degradation Due to Hydrogen Deactivation of Dopant Determined by Junction Profiling.
Authors: Wang, Yun-Yu1 (AUTHOR), Nxumalo, Jochonia1 (AUTHOR), Zhang, Haigang1 (AUTHOR), Smith, Mike1 (AUTHOR)
Source: Microscopy Today. May2026, Vol. 34 Issue 3, p26-33. 8p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 193688713
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: NMOS Hot Carrier Stressed Current Degradation Due to Hydrogen Deactivation of Dopant Determined by Junction Profiling.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Wang%2C+Yun-Yu%22">Wang, Yun-Yu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nxumalo%2C+Jochonia%22">Nxumalo, Jochonia</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Haigang%22">Zhang, Haigang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Smith%2C+Mike%22">Smith, Mike</searchLink><relatesTo>1</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microscopy+Today%22">Microscopy Today</searchLink>. May2026, Vol. 34 Issue 3, p26-33. 8p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193688713
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1093/mictod/qaag050
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 26
    Titles:
      – TitleFull: NMOS Hot Carrier Stressed Current Degradation Due to Hydrogen Deactivation of Dopant Determined by Junction Profiling.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wang, Yun-Yu
      – PersonEntity:
          Name:
            NameFull: Nxumalo, Jochonia
      – PersonEntity:
          Name:
            NameFull: Zhang, Haigang
      – PersonEntity:
          Name:
            NameFull: Smith, Mike
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 15519295
          Numbering:
            – Type: volume
              Value: 34
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Microscopy Today
              Type: main
ResultId 1