SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.
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| Title: | SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection. |
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| Authors: | Du, Xianjun1,2 (AUTHOR) xdu@lut.edu.cn, Wang, Jingxiang1 (AUTHOR) |
| Source: | Journal of Electronic Testing. Apr2026, Vol. 42 Issue 2, p273-286. 14p. |
| Database: | Academic Search Ultimate |
| ISSN: | 09238174 |
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| DOI: | 10.1007/s10836-026-06220-x |
