APA (7th ed.) Citation

Du, X., & Wang, J. (2026). SAF-YOLO: A Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection. Journal of Electronic Testing, 42(2), 273. https://doi.org/10.1007/s10836-026-06220-x

Chicago Style (17th ed.) Citation

Du, Xianjun, and Jingxiang Wang. "SAF-YOLO: A Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection." Journal of Electronic Testing 42, no. 2 (2026): 273. https://doi.org/10.1007/s10836-026-06220-x.

MLA (9th ed.) Citation

Du, Xianjun, and Jingxiang Wang. "SAF-YOLO: A Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection." Journal of Electronic Testing, vol. 42, no. 2, 2026, p. 273, https://doi.org/10.1007/s10836-026-06220-x.