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SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.

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Bibliographic Details
Title: SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.
Authors: Du, Xianjun1,2 (AUTHOR) xdu@lut.edu.cn, Wang, Jingxiang1 (AUTHOR)
Source: Journal of Electronic Testing. Apr2026, Vol. 42 Issue 2, p273-286. 14p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 194545740
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Du%2C+Xianjun%22">Du, Xianjun</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> xdu@lut.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Wang%2C+Jingxiang%22">Wang, Jingxiang</searchLink><relatesTo>1</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Testing%22">Journal of Electronic Testing</searchLink>. Apr2026, Vol. 42 Issue 2, p273-286. 14p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194545740
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10836-026-06220-x
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 14
        StartPage: 273
    Titles:
      – TitleFull: SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Du, Xianjun
      – PersonEntity:
          Name:
            NameFull: Wang, Jingxiang
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 09238174
          Numbering:
            – Type: volume
              Value: 42
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Journal of Electronic Testing
              Type: main
ResultId 1