Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence.

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Bibliographic Details
Title: Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence.
Authors: Bitter, M.1, Hill, K. W.1, Scott, S.1, Feder, R.1, Ko, Jinseok2, Ince-Cushman, A.2, Rice, J. E.2
Source: Review of Scientific Instruments. Oct2008, Vol. 79 Issue 10, p10E927. 3p. 2 Diagrams.
Database: Academic Search Ultimate
Description
ISSN:00346748
DOI:10.1063/1.2965010