Bitter, M., Hill, K. W., Scott, S., Feder, R., Ko, J., Ince-Cushman, A., & Rice, J. E. (2008). Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence. Review of Scientific Instruments, 79(10), 10E927. https://doi.org/10.1063/1.2965010
Chicago Style (17th ed.) CitationBitter, M., K. W. Hill, S. Scott, R. Feder, Jinseok Ko, A. Ince-Cushman, and J. E. Rice. "Wide-angle Point-to-point X-ray Imaging with Almost Arbitrarily Large Angles of Incidence." Review of Scientific Instruments 79, no. 10 (2008): 10E927. https://doi.org/10.1063/1.2965010.
MLA (9th ed.) CitationBitter, M., et al. "Wide-angle Point-to-point X-ray Imaging with Almost Arbitrarily Large Angles of Incidence." Review of Scientific Instruments, vol. 79, no. 10, 2008, p. 10E927, https://doi.org/10.1063/1.2965010.