Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence.

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Title: Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence.
Authors: Bitter, M.1, Hill, K. W.1, Scott, S.1, Feder, R.1, Ko, Jinseok2, Ince-Cushman, A.2, Rice, J. E.2
Source: Review of Scientific Instruments. Oct2008, Vol. 79 Issue 10, p10E927. 3p. 2 Diagrams.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 35150071
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>. Oct2008, Vol. 79 Issue 10, p10E927. 3p. 2 Diagrams.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=35150071
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.2965010
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      – Code: eng
        Text: English
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        StartPage: 10E927
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      – TitleFull: Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence.
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            NameFull: Bitter, M.
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            NameFull: Hill, K. W.
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            NameFull: Ko, Jinseok
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            – D: 01
              M: 10
              Text: Oct2008
              Type: published
              Y: 2008
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