APA (7th ed.) Citation

Zhou, Y., Wang, T., Li, H., Lv, T., & Li, X. (2016). Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 35(6), 999. https://doi.org/10.1109/TCAD.2015.2481863

Chicago Style (17th ed.) Citation

Zhou, Yanhong, Tiancheng Wang, Huawei Li, Tao Lv, and Xiaowei Li. "Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 35, no. 6 (2016): 999. https://doi.org/10.1109/TCAD.2015.2481863.

MLA (9th ed.) Citation

Zhou, Yanhong, et al. "Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 35, no. 6, 2016, p. 999, https://doi.org/10.1109/TCAD.2015.2481863.