Bibliographic Details
| Title: |
LFSR-Based Generation of Partially-Functional Broadside Tests. |
| Authors: |
Pomeranz, Irith1 |
| Source: |
IEEE Transactions on Computers. Aug2016, Vol. 65 Issue 8, p2659-2664. 6p. |
| Subjects: |
Data compression, Test generators, Hamming distance, Scanning systems, Information theory, Electronic data processing |
| Abstract: |
This paper describes a procedure that computes seeds for LFSR-based generation of partially-functional broadside tests. Existing LFSR-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed si in order to reduce the Hamming distance between the scan-in state pi that si creates and a reachable state rj . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
