Bibliographic Details
| Title: |
In situ XRD and Raman study of the phase transition in V2O5 xerogels. |
| Authors: |
Shvets, Petr1 (AUTHOR) pshvets@kantiana.ru, Maksimova, Ksenia1 (AUTHOR), Goikhman, Aleksandr1 (AUTHOR) |
| Source: |
Journal of Non-Crystalline Solids. Feb2024, Vol. 625, pN.PAG-N.PAG. 1p. |
| Subjects: |
Phase transitions, X-ray diffraction, Vanadium oxide, Xerogels, Raman spectroscopy |
| Abstract: |
• Vanadium oxide xerogel can exist in two phases with different atomic arrangements. • Low-temperature phase has a special atomic arrangement with V 2 O 5 bilayers. • High-temperature phase (HTP) is closely related to α-V 2 O 5 crystals. • HTP can be stabilized in ambient when amorphous vanadium oxide reacts with water. • This reaction led to erroneous assignments for different materials, including δ-V 2 O 5. Vanadium oxide xerogel samples (V 2 O 5 ∙nH 2 O) were successfully synthesized using a liquid phase reaction between α-V 2 O 5 and H 2 O 2 , as well as through the interaction of amorphous V 2 O 5 films with atmospheric water. The samples were systematically investigated by X-ray diffraction and Raman spectroscopy. Temperature-dependent studies confirmed the existence of two distinct phases. Depending on synthesis and processing protocols, either phase can be stabilized in ambient conditions. It was proved that the formation of a high-temperature phase from amorphous vanadium oxide previously led to some misinterpretations associated with the high-pressure δ-V 2 O 5 polymorph. While current structural models of vanadium oxide xerogel provide some insights, our findings underscore the exciting potential for refining and expanding these models in future research endeavors. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |