Bibliographic Details
| Title: |
Tunable electronic band gap of bilayer silicon carbide (SiC): The effect of interlayer stacking, electric field and strain. |
| Authors: |
Lin, Heng-Fu1,2 (AUTHOR) hflin@wust.edu.cn, Xu, Lu-Ya1 (AUTHOR), Liu, Hui-Ying1 (AUTHOR), Hou, Ting-Ping1,2 (AUTHOR), Liu, Nan-Shu1,3 (AUTHOR) liuns0215@gmail.com |
| Source: |
Physica B. Mar2025, Vol. 700, pN.PAG-N.PAG. 1p. |
| Subjects: |
Electronic band structure, Atomic structure, Semiconductors, Carbon-based materials, Density functional theory |
| Abstract: |
Recently, 2D semiconducting carbon material SiC has been proposed to overcome the zero bandgap problem of the graphene, which are potential used in the future electronic and optoelectronic devices. Here, we use a simple graphical method combined with density functional theory to examine the atomic structure and electronic band gap of the bilayer SiC. The SiC bilayer with AA, AC, AD, and BC stacking configurations can be stabilized through van der Waals interactions and their band gap are strongly dependent on the stacking order. The AC stacking is most energy favorable, and it is a semiconductor with an indirect band gap size of 1.97 eV under PBE functional level and 2.76 eV under HSE06 level. The band gap will increase (decrease) under positive (negative) vertical electrical field E ⊥ , in-plane compressive (tensive) strain ε and vertical tensive (compressive) strain δ. The bilayer SiC with AC stacking will transition to a direct band gap semiconductor at −0.5< E ⊥ <0.0 V/Å, ε > 0, and −0.1< δ < 0.0. Furthermore, the optical absorption coefficient can be significantly tuned by in-plane ε and vertical strain δ. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |