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LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTS.

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Bibliographic Details
Title: LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTS.
Authors: Cretu, B.1 bogdan.cretu@ensicaen.fr, Tahiat, A.1, Germanicus, R. Coq1, Bezerra, F.2, Bunel, C.3, Veloso, A.4, Simoen, E.5
Source: Electronic Device Failure Analysis. Feb2025, Vol. 27 Issue 1, p8-17. 8p.
Subjects: Electron traps, Passive components, Silicon nanowires, Nanowires, Deep level transient spectroscopy, Noise
Abstract: The article focuses on low frequency noise spectroscopy as a powerful diagnostic tool for detecting and characterizing traps in active and passive semiconductor components. Topics include analyzing various noise contributions such as flicker, white, and generation-recombination noise, employing Arrhenius plots to determine trap energy levels and capture cross sections, and applying these methods to assess trap characteristics in advanced nanoscale transistor technologies.
Database: Engineering Source
Description
Abstract:The article focuses on low frequency noise spectroscopy as a powerful diagnostic tool for detecting and characterizing traps in active and passive semiconductor components. Topics include analyzing various noise contributions such as flicker, white, and generation-recombination noise, employing Arrhenius plots to determine trap energy levels and capture cross sections, and applying these methods to assess trap characteristics in advanced nanoscale transistor technologies.
ISSN:15370755
DOI:10.31399/asm.edfa.2025-1.p008