APA (7th ed.) Citation

Cretu, B., Tahiat, A., Germanicus, R. C., Bezerra, F., Bunel, C., Veloso, A., & Simoen, E. (2025). LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTS. Electronic Device Failure Analysis, 27(1), 8. https://doi.org/10.31399/asm.edfa.2025-1.p008

Chicago Style (17th ed.) Citation

Cretu, B., A. Tahiat, R. Coq Germanicus, F. Bezerra, C. Bunel, A. Veloso, and E. Simoen. "LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTS." Electronic Device Failure Analysis 27, no. 1 (2025): 8. https://doi.org/10.31399/asm.edfa.2025-1.p008.

MLA (9th ed.) Citation

Cretu, B., et al. "LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTS." Electronic Device Failure Analysis, vol. 27, no. 1, 2025, p. 8, https://doi.org/10.31399/asm.edfa.2025-1.p008.