Bibliographic Details
| Title: |
ISTFA 2025 AND THE NEXT ERA OF FAILURE ANALYSIS. |
| Authors: |
Parente, Renee S. renee.parente@amd.com |
| Source: |
Electronic Device Failure Analysis. Feb2026, Vol. 28 Issue 1, p22-24. 3p. |
| Subjects: |
Failure analysis, Heterogeneous computing, Information technology, Moore's law, Microelectronics, Electronic packaging |
| Abstract: |
The article reflects on ISTFA 2025 as a pivotal moment for the failure analysis community, highlighting strong global engagement and a shared commitment to addressing the challenges of heterogeneous computing and advanced packaging beyond Moore's Law. Topics include key themes and outcomes of ISTFA 2025, emerging failure analysis challenges driven by advanced architectures, and the importance of collaboration, innovation and policy awareness in the future of microelectronics. |
| Database: |
Engineering Source |
